Noninvasive Voltage Measurement Through an On-chip Test Structure
نویسندگان
چکیده
A method to evaluate internal voltages through a builtin test structure is presented. Multiplexers are used to increase accessibility. The test structure does not affect normal operation of the circuit. Individual subcircuits can be tested selectivel,v based on evaiuated internal voltages.
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تاریخ انتشار 2007